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High Fidelity Avionics Software Test System
Eidetics
Corporation has developed the next generation approach to integrated avionics
systems testing with its High Fidelity Avionics Software Test System (HI-FAST).
HI-FAST is currently in operation in international applications and at Edwards Air Force Base, Edwards, CA. HI-FAST provides multiple bus avionics
operation and testing in real-time. The system's aircraft simulation models are
high fidelity, allowing software testing under both systems and aircraft dynamic
conditions.
A major feature
of HI-FAST is the Man-Machine Interface. Through a set of user friendly,
menu-driven panels, the user can control, modify and observe every aspect of the
simulation.
HI-FAST has
real-time monitoring and plotting of packed and unpacked data. Data can be
collected and stored from shared memory and from multiple MIL-STD-1553 multiplex
busses. The data can be stored in data reduction, weapon scoring, playback and
mission debrief formats.
The
aircraft's environment includes all atmospheric effects of temperature,
altitude, wind gusts and turbulence, and also includes interactive hostile /
friendly aircraft and ground targets. This allows Unit Under Test testing under
realistic stress conditions.
The system
library contains a large number of avionics and system models. The software
interface between these models, the airframe and the unit under test, is the
equivalent of a MUX-BUS Interface Control Document which is resident in
reflective memory. An ICD development tool automatically converts the aircraft
level ICD into the form required to pack and unpack I/O data.
A comprehensive
data reduction and analysis tool allows multi-variable tabular and graphical
presentation of any selected data range and can perform statistical, sort and
filtering operations on this data.
HI-FAST
MAN-IN-THE-LOOP Avionics Testing
HI-FAST will provide the user with a state-of-the-art turnkey avionics
test capability that will pay for itself on the very first program by
substantially reducing cost, schedule, and technical risk.
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